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COLLISIONS BETWEEN CS⁺ IONS - A FURTHER EXPERIMENTAL STUDYNEILL PA; ANGEL GC; DUNN KF et al.1982; JOURNAL OF PHYSICS B: ATOMIC AND MOLECULAR PHYSICS; ISSN 0022-3700; GBR; DA. 1982; VOL. 15; NO 22; PP. 4219-4230; BIBL. 18 REF.Article

Theoretical study of the 4d photoabsorption of the Cs⁺ ionLIU, Xiang-Lu; DONG, Chen-Zhong; DING, Xiao-Bin et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2010, Vol 43, Num 5, issn 0953-4075, 055202.1-055202.6Article

Field emission ion source of molecular cesium ionsHELM, H; MOLLER, R.Review of scientific instruments. 1983, Vol 54, Num 7, pp 837-840, issn 0034-6748Article

EFFECT OF CLUSTER SURFACE ENERGIES ON SECONDARY-ION-INTENSITY DISTRIBUTIONS FROM IONIC CRYSTALSCAMPANA JE; BARLAK TM; COLTON RJ et al.1981; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1981; VOL. 47; NO 15; PP. 1046-1049; BIBL. 27 REF.Article

TIME-OF-FLIGHT MEASUREMENTS OF CESUIM-IODIDE CLUSTER IONSENS W; BEAVIS R; STANDING KG et al.1983; PHYSICAL REVIEW LETTERS; ISSN 0031-9007; USA; DA. 1983; VOL. 50; NO 1; PP. 27-30; BIBL. 12 REF.Article

CHARGE EXCHANGE BETWEEN CS⁺ IONS AND RELATED STUDIESERMOLAEV AM; NOBLE CJ; BRANSDEN BH et al.1982; J. PHYS. B; ISSN 0022-3700; GBR; DA. 1982; VOL. 15; NO 3; PP. 457-469; BIBL. 32 REF.Article

ABSOLUTE EXPERIMENTAL CROSS SECTIONS FOR THE ELECTRON IMPACT SINGLE, DOUBLE, TRIPLE, AND QUADRUPLE IONIZATION OF CS⁺ IONSHERTLING DR; FEENEY RK; HUGHES DW et al.1982; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 8; PP. 5427-5434; BIBL. 28 REF.Article

Focussing of a transient low energy Cs⁺ probe for improved NanoSIMS characterizations : Study of charged particle opticsBERNHEIM, M; WU, T. D; GUERQUIN-KERN, J. L et al.EPJ. Applied physics (Print). 2008, Vol 42, Num 3, pp 311-319, issn 1286-0042, 9 p.Article

Energy-dependent relative charge transfer cross sections of Cs⁺+ Rb(5s, 5p)NGUYEN, H; BREDY, R; FLECHARD, X et al.Journal of physics. B. Atomic, molecular and optical physics (Print). 2013, Vol 46, Num 11, issn 0953-4075, 115205.1-115205.7Article

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Range distribution of implanted cesium ions in silicon dioxide filmsFISHBEIN, B. J; PLUMMER, J. D.Journal of applied physics. 1988, Vol 63, Num 12, pp 5887-5889, issn 0021-8979Article

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Sputtering of negative hydrogen ions by cesium bombardmentLOPES, J. L; GREER, J. A; SEIDL, M et al.Journal of applied physics. 1986, Vol 60, Num 1, pp 17-23, issn 0021-8979Article

Stabilization of charge on electrically insulating surfaces during SIMS experiments. Experimental and theoretical studies of the specimen isolation methodLAU, W. M; MCINTYRE, N. S; METSON, J. B et al.Surface and interface analysis. 1985, Vol 7, Num 6, pp 274-281, issn 0142-2421Article

Dynamical study of the Cs⁺(¹S₀)+Mg(3 ¹S₀) non adiabatic collision system in the few keV energy rangeSABIDP, M; DE ANDRES, J; SOGAS, J et al.The European physical journal. D, Atomic, molecular and optical physics (Print). 2008, Vol 47, Num 1, pp 63-70, issn 1434-6060, 8 p.Article

Computer modeling of the influence of the orientation of single-crystal Mo on the scattering of low energy Cs⁺ ionsEVSTIFEEV, V. V; IVANOV, I. V; TORSTVEIT, S et al.Soviet physics. Technical physics. 1991, Vol 36, Num 12, pp 1406-1407, issn 0038-5662Article

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Surface microtopography and compositional change of cesium-ion-bombarded semiconductor surfacesHOMMA, Y; OKAMOTO, H; ISHII, Y et al.Japanese journal of applied physics. 1985, Vol 24, Num 8, pp 934-939, issn 0021-4922Article

Dopant atom and cluster ion behaviour in silicon arising in SIMS depth profilingRICHTER, C.-E; TRAPP, M.International journal of mass spectrometry and ion processes. 1984, Vol 62, Num 1, pp 25-32, issn 0168-1176Article

Collapse of the 4f orbital for Xe-like ionsCHENG, K. T; FROESE FISCHER, C.Physical review. A, General physics. 1983, Vol 28, Num 5, pp 2811-2819, issn 0556-2791Article

INFLUENCE OF INCREASING NUCLEAR CHARGE ON THE RYDBERG SPECTRA OF XE, CS⁺, AND BA⁺⁺: CORRELATION, TERM DEPENDENCE, AND AUTOIONIZATIONHILL WT III; CHENG KT; JOHNSON WR et al.1982; PHYSICAL REVIEW LETTERS; ISSN 0031-9007; USA; DA. 1982; VOL. 49; NO 22; PP. 1631-1635; BIBL. 13 REF.Article